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Probe Systems

use programmable motorized staging to position contacting pin s.

See Also: Probe Stations, Flying Probes


Showing results: 301 - 315 of 405 items found.

  • Concrete Strength Testers

    Qualitest International Inc.

    This category of products comprises the range of instruments utilized to evaluate construction material strength. The range of instruments is typically considered to be two parts. The first are non-destructive field tests of compressive strength. The second are tensile field tester systems to either determine the tensile strength of an overlay or bond material, or tensile strength of anchors embedded in the concrete. The first group is pure Non-Destructive Testing where the strength of the material is determined by correlation to another parameter more easily available and readily apparent. This is typically the hardness of the concrete or the resistance to penetration by either a pin or probe. The Windsor Probe, Windsor Pin and our line of Rebound Hammers all fall within this category. These are widely used standard tests and as such have seen use throughout the world.

  • Water Filler for Nickel-Cadmium Cells

    MasterFiller - JFM Engineering

    The MasterFiller is an instrument designed to deliver measured quantities of distilled water as required in the service of Aircraft Nickel-Cadmium batteries.· The MasterFiller consists of a microprocessor controlled pump with a level sensing probe, a keypad and display and an external 12VDC power supply (or optional battery).· The MasterFiller is part of a system comprising Intelligent Charger-Analyzers and Software for Battery Data Acquisition and Analysis, designed to improve the accuracy and efficiency of the process of testing batteries for airworthiness certification.

  • Laser Probing Tool

    InfraScan™ LTM - Checkpoint Technologies, LLC.

    Checkpoint Technologies' laser probing tool, the InfraScan LTM (Laster Timing Tool), employs a cw laser to optically probe circuit node to produce electronic waveforms. Checkpoint Technologies' stabilized laser source and optical-to-electronic conversion module provides high bandwidth optical probing up to 12 GHz. The LTM can be integrated into an existing InfraScan product such as an INV or TDE or installed as a stand alone system.

  • Surface Analysis

    Innova-IRIS - Bruker Optics

    This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.

  • Spectral Response SystemsQuantum Efficiency SystemsIPCE Measurement Systems

    Photo Emission Tech., Inc.

    QE system provides electronics and software designed for fully automated measurement of external quantum efficiency of solar cells. All systems include probes and a fixed plate sample stage for samples up to 150 mm x 150 mm. The main system components include: custom designed software, measurement electronics, and computer system (Windows 8 operating system). The measurement involves focusing monochromatic light to a spot on the device under test, then accurately measuring the photon flux and current from the test cell. The system utilizes a dual beam configuration with lock-in detection, providing an absolute accuracy of ±3%. The QE system uses a grating monochrometer with silicon/InGaAs/Ge detectors. The system includes automatic order sorting filters and two light sources for monochromatic illumination (a Xenon- arc lamp and a halogen lamp). A single lock-in amplifier is used to measure both the reference detector and test device. The main system comes with all the hardware needed to measure quantum efficiency, a fixed plate sample stage and probes.

  • Portable Calibration Shaker Table

    AT-2030 - Agate Technology

    The AT-2030 portable calibration shaker table is designed for simple accelerometer and vibration transducer calibration without the need for advanced features. AT-2030 shaker table and vibration calibrator is a variable frequency, variable amplitude, battery operated portable shaker capable of calibrating accelerometers, transducers, and proximity probes. Applications are producing a known vibration signal in g’s, mils, or ips for sensor, wiring, instrumentation, and system checkout in vibration condition monitoring applications.

  • Triple Quadrupole Mass Spectrometry

    Xevo TQ-XS - Waters Corporation

    Demands on analytical laboratories are changing and every laboratory needs to ensure it can keep pace with these changes. The Xevo® TQ-XS offers: *StepWave XS™ ion guide that provides increased sensitivity for challenging compounds. *Enhanced detection system with six orders of linear dynamic range to ensure sensitivity is accessible. *Tool-free probe design reduces the time taken for any routine maintenance and provides improved reproducibility between users.

  • Pulsed IV Systems

    AM3200-Series - Maury Microwave Corporation

    AMCAD Engineering has created professional, industry-proven pulsing technology for both standalone IV-testing (Pulsed IV, PIV) as well as pulsed-bias load pull (Pulsed Load Pull, PLP) and high-voltage power semiconductor applications. Systems come equipped with a mainframe controller which includes integrated power supplies. Input and output pulser modules (probes, pulsers) are selected for specific applications and are available in bipolar ±25V/1A and high-voltage 250V/30A models.

  • Robotic Probing of Circuit Cards

    BCO, Inc.

    System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.

  • NI Semiconductor Test Systems

    NI

    The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.

  • Full Wafer Test System

    FOX-1P - Aehr Test Systems

    Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.

  • Flying Probe Tester

    FA1817 - HIOKI E.E. Corp

    Flying Probe Tester FA1817, an automatic testing system designed to inspect printed wiring on bare boards. The FA1817’s features and capabilities make it ideal for use in inspecting high-density printed wiring boards. With support for a broad range of test types, from low-resistance measurement to high-insulation-resistance measurement, the system reliably detects the latent defects that trouble end-users.

  • Psychrometers

    Fieldpiece Instruments, Inc

    The In-Duct Hot-Wire Anemometer & Psychrometer accessory head, AAT3 allows HVACR professionals to measure air velocity, temperature, and %RH all in one tool. The engineered 38" telescoping probe with laser etching and quick-response sensor provides quick and easy airflow measurements from the correct location--near the evaporator. When using with the Fieldpiece HVAC Guide System Analyzers, the AAT3 can automatically calculate target super heat and target evaporator exit temperature.

  • Reference Temperature Sensors

    AMETEK Sensors, Test & Calibration

    Our reference sensors can be used as your daily working-reference sensors in laboratory or field calibration applications. A large selection of types are available, including; straight, 90 degree angle, 4 mm or 1/4”. The superior design and specifications combined with a long history of reliability and low drift have made the STS probes the working-standard in many EN/IEC 17025 accredited laboratories worldwide. The DLC sensors are a part of our patented Dynamic Load Compensation system.

  • Humidity & Temperature Probes & Filters

    Rotronic Measurement Solutions

    The HygroClip2 is a completely new type of probe in a class of it's own in terms of accuracy and performance. Thanks to the new AirChip3000 technology, it also boasts a unique calibration and adjustment process as well as many other superb innovations. At the same time ROTRONIC has taken humidity measurement technology to a whole new level of performance and reliability: the HygroClip2 offers you the best possible reproducibility and a superb system accuracy of < ±0.8 %rh and ±0.1 K.

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